JTAG Technologies will be displaying much of its current hardware range and will also offer live software demonstrations at SMTA 2016. Experienced JTAG test engineers will be on-hand to discuss practical test issues and advise on solutions – just bring your questions and/or your target board to Booth 136 for an honest appraisal.
The latest product on display will be an example of JTAG’s ‘fixture embedded’ test technology – the JT 5705/FXT multi-function JTAG tester built into one the small linear series of cassette-based re-configurable fixtures of Everett Charles Technologies (ECT), a world-renowned name in PCB test fixtures and interface.
The JT 5705/FXT is a compact, single-board test system that supports analog measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing and also in-system device programming. Within the fixture multiple JT 5705/FXT tester cards can be mounted on purpose built carriers featuring the ATE industry standard ‘Pylon’ connectors, making test system build a snap.
Other production-oriented solutions on display will include JTAG’s extensive ‘Symphony’ range of 3rd party tester integration products. Use of the Symphony options allows the very latest professional JTAG/boundary-scan capabilities to be added to existing ATE from Teradyne, Keysight, SPEA, Seica, NI and others…
Background to the JT 5705/FXT
Many new electronic designs feature some devices such as programmable logic and micro-controllers/SOCs that feature JTAG built-in test capabilities, however due to mixed signal nature of most of these designs it is useful to have mix of test signals to provide analog stimuli and measurement, digital I/O channels and so on. The JT 5705/FXT provides just these features allowing a easy build of a comprehensive board tester/programmer.
Peter van den Eijnden, MD JTAG Technologies comments: “Industrial controls/automation and automotive electronics are just two examples where we expect to see a high demand for this type of product. A great many ECUs require an analog/sensor stimulus which registers back to a microprocessor where the values can be checked using boundary-scan or JTAG emulative test methods – as supported by JTAG Technologies CoreCommander tools.”
