Solutions Help Designers Characterize and Model Cutting-Edge CMOS and Compound Semiconductor Devices
Keysight Technologies, Inc. (NYSE: KEYS) today announced it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.
IRPS is the world’s premier platform for presenting pioneering work in semiconductor reliability. The 2015 technical program consists of platform and poster presentations. Four different tutorial tracks, three reliability year-in-review talks, six workshops, a panel discussion and an equipment exhibit will complement this year’s program.
Keysight application experts will be on hand to demonstrate:
- Keysight end-to-end solutions for semiconductor device characterization and SPICE model extraction that include automatic on-wafer measurement, 1/f noise and RTN measurement, advanced model extraction flows, and automatic and intelligent qualification of SPICE libraries
- The B1500A Semiconductor Device Analyzer, which now offers software and hardware enhancements that greatly improve performance and usability for parametric test
- The B1506A Power Device Analyzer for Circuit Design, which can measure all power device datasheet parameters up to 3 kV/1500 A and also calculate power loss
- The B2900A Benchtop SMU, which provides a cost-effective solution with color GUI and a wide measurement range, such as 210 V and 3 A (DC) or 10.5 A (pulsed)
Additional information is available at www.irps.org.
